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TFM-100

TFM-100 Film Thickness Analyzer

Features

TFM-100 Series is a non-contact coating and thin film thickness analyzer(Reflectometer). 
TFM has a user friendly interface that enables anyone to get results easily.
*Non-contact and Non-destructive
*Simple measurement with a few buttons
*Various substrates (wafer, glass, metal, etc.)

Specifications

*Measurement range:  0.3 ㎛ to 500 ㎛ (depending on film type)
*Measurement spot size:​ Approximately 4 mm (Option: 40 ㎛, 80 ㎛)
*Repeatability(10x): ≤ 0.001 ㎛ at 1-㎛ SiO2 on Si Wafer
*Stage size: 20 x 20 cm
*Detector: 22 x 22 x 7 cm

Standards
Related Products

Advantage

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